Abstract

Recent Progress in TOF-SIMS Analysis

Anil Ghule, Professor, Shivaji University

With the growing knowledge and progress in science and technology, particularly nanotechnology, interest has been developed to integrate nanosciences into present and new emerging technology. It is also important to have efficient tools to cope up with the growing needs of characterization of complex systems involving nano-materials. Thus, scientists are in search of alternative tools or methods for their characterization of novel nano-materials. Among the various tools developed over a period of time, TOF-SIMS with its unique capability of providing information on atomic or molecular level while dealing with organic, inorganic, organic-inorganic hybrid, and polymeric samples is justifying its role in interdisciplinary research and nanotechnology. This presentation is focused on demonstrating the utility of TOF-SIMS as an advanced characterization tool for analysis of wide variety of samples including nano-material analysis. Method development and analysis of wide variety of samples like range of semiconductor nanomaterials, monitoring synthesis, semiconductor electronic materials, multilayered structures, OLED, functionalized carbon nanotubes, quantum dots immobilized self-assembled monolayer systems, nanomaterial coated paper, cotton, and wool fibers, distribution of metal ions in biological samples, analysis of drugs of abuse, biomedical samples etc would be discussed in detail along with the sample preparation and methods employed. One of the key developments in TOF-SIMS was proved by comparing the capability of the technique with thermogravimetric analyzer and thermo-Raman spectroscopy for in-situ monitoring the synthesis of ZnO nanoparticles. Depth profile and 3D imaging capabilities of TOF-SIMS are also explored to understand the distribution of the metal ions and nanoparticles in the samples. This talk will also introduce new avenues in research using TOF-SIMS.