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SELECTBIO Conferences AgriGenomics India 2017

Abstract



Marker Assisted Screening of Indian Wheat Varieties for the presence of Alien Leaf Rust Resistance Gene Lr34 and Linked Gene Yr18

Anjali Rai, Research Scholar, Indian Agriculture Research Institute

Rusts are among the most important fungal diseases of wheat worldwide and cause between 20-40% of yield losses annually. Resistance breeding to overcome the threat posed by the rust pathogens has been considered as the most practical and durable approach in wheat. One such gene for leaf rust resistance is Lr34 closely linked with stripe rust resistance gene Yr18 and a stem rust resistance gene Sr57. Lr34, known as adult plant resistance gene has been introduced in Indian wheat germplasm from several sources especially the CIMMYT derived germplasm. A molecular marker csLv34 was used to screen sixty seven wheat varieties released in the last two decades to ascertain the presence of Lr34 gene. 24 wheat varieties showed the amplification of the marker. The results were also corroborated with Average Coefficient of Infection data of these varieties. This information will be useful to the breeders to assess the presence of the genes Lr34/Yr18/Sr57 during the development of new germplasm.


Add to Calendar ▼2017-07-20 00:00:002017-07-21 00:00:00Europe/LondonAgriGenomics India 2017AgriGenomics India 2017 in ChandigarhChandigarhSELECTBIOenquiries@selectbiosciences.com