Tong Geon Lee,
Postdoctoral Research Associate
Tong Geon Lee, Ph.D. is a postdoctoral research associate at the University of Illinois. His research interests center on the use of genomic and high performance computational tools to pursue crop improvement. Dr. Lee’s research at the University of Illinois focuses on the genomic variants that control soybean traits. He discovered that plant disease resistance loci can consist of a multigene cluster copy number variation of non-canonical resistance genes in tandem formation. He received his B.S. (2003) in Agriculture, M.S. (2005) and Ph.D. (2010) in Plant Biotechnology and Genetic Engineering from Korea University. Dr. Lee served as a Research Professor at Korea University in 2010.
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